The world’s first and only commercially available electron backscatter diffraction (EBSD) detector with unparalleled performance as low as 3 kV. This direct detection system is ideal for beam-sensitive perovskite, ceramic, or semiconductor materials that are difficult to analyze using conventional EBSD systems.
This revolutionary series utilizes single-electron detection to provide the high-fidelity EBSD pattern quality and unparalleled sensitivity you expect to advance your research.
1. Reveals never-before-seen structures by using low beam currents and energies to prevent damage
2. Eliminates the need for conductive coatings or low-vacuum SEM settings to assess non-conductive materials like ceramics that charge under typical beam currents
3. At low beam currents, obtains high-quality EBSD patterns and maps for investigating the effects of grain boundaries, grain size, and crystal orientation
4. Uses high-dynamic-range imaging to ensure excellent EBSD pattern quality
5. Enables the collection of extremely sharp EBSD patterns without using phosphor or optical lenses
6. Improves spatial resolution at lower acceleration voltages
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