TrueSurface Microscopy

WITec´s award-winning TrueSurface Microscopy allows confocal Raman imaging along heavily inclined or very rough samples with the surface held in constant focus while maintaining the highest confocality. It is thereby possible to perform confocal imaging measurements parallel with and guided by a large area topographic scan.

The core element of this revolutionary imaging mode is an integrated sensor for optical profilometry. It is directly installed at the microscope turret, which facilitates user-friendly and convenient handling.

WITec’s patented TrueSurface Microscopy option enables confocal Raman imaging, guided by surface topography. Topographic Raman Imaging, a technique pioneered by WITec, uses an advanced optical profilometer integrated within the instrument to provide one-pass simultaneous operation.

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Applications TrueSurface Microscopy

Industries Aerospace, Civil Infrastructure, Commercial Services, Defence & Security, Education & Research, Manufacturing, Mining, Oil & Gas, Power Generation, Utilities - Electricity and Water

TrueSurface Microscopy follows the surface topography with high precision so that even rough or inclined samples always stay in focus
The topographic coordinates from the profilometer measurement are used to follow the sample surface in confocal Raman imaging mode perfectly
Combining large-area surface topography profiling with confocal Raman imaging and/or AFM allows for Topographic confocal Raman imaging; Topographic large-area surface imaging; Topographic spectroscopic Imaging
Applications: Pharmaceutics, Cosmetics, and Food Science, Geoscience.

TrueSurface Microscopy

Product Brochures

WITec-TRUESURFACE.pdf